An improved TM method for full two-port calibration of the asymmetric test fixtures

Ning Hua Zhu; Chao Liu; Edwin Y.B. Pun; Po Sheun Chung

doi:10.1002/mop.20847

An improved TM method for full two-port calibration of the asymmetric test fixtures

Ning Hua Zhu^*
, Chao Liu
, Edwin Y.B. Pun
, Po Sheun Chung

^*Corresponding author for this work

CAS - Institute of Semiconductors
City University of Hong Kong

Research output: Contribution to journal › Article › peer-review

Abstract

Three known standards, including at least one transmission standard, are normally required for the full two-port calibration of test fixtures. Based on the triple-through method, a new general-purpose calibration procedure using only one known reflection standard is proposed in this paper. The experimental results show that our method can provide a simple and accurate approach to full two-port calibration of the asymmetric test fixtures.

Original language	English
Pages (from-to)	438-441
Number of pages	4
Journal	Microwave and Optical Technology Letters
Volume	45
Issue number	5
DOIs	https://doi.org/10.1002/mop.20847
State	Published - 5 Jun 2005
Externally published	Yes

Keywords

Calibration
Deembedding
Microwave network analyzer
Scattering parameter measurement
Test fixtures

Access to Document

10.1002/mop.20847

Cite this

@article{d728311328f64c17ae8b07c5ecc6a1d6,

title = "An improved TM method for full two-port calibration of the asymmetric test fixtures",

abstract = "Three known standards, including at least one transmission standard, are normally required for the full two-port calibration of test fixtures. Based on the triple-through method, a new general-purpose calibration procedure using only one known reflection standard is proposed in this paper. The experimental results show that our method can provide a simple and accurate approach to full two-port calibration of the asymmetric test fixtures.",

keywords = "Calibration, Deembedding, Microwave network analyzer, Scattering parameter measurement, Test fixtures",

author = "Zhu, \{Ning Hua\} and Chao Liu and Pun, \{Edwin Y.B.\} and Chung, \{Po Sheun\}",

year = "2005",

month = jun,

day = "5",

doi = "10.1002/mop.20847",

language = "英语",

volume = "45",

pages = "438--441",

journal = "Microwave and Optical Technology Letters",

issn = "0895-2477",

publisher = "John Wiley \& Sons Inc.",

number = "5",

}

TY - JOUR

T1 - An improved TM method for full two-port calibration of the asymmetric test fixtures

AU - Zhu, Ning Hua

AU - Liu, Chao

AU - Pun, Edwin Y.B.

AU - Chung, Po Sheun

PY - 2005/6/5

Y1 - 2005/6/5

N2 - Three known standards, including at least one transmission standard, are normally required for the full two-port calibration of test fixtures. Based on the triple-through method, a new general-purpose calibration procedure using only one known reflection standard is proposed in this paper. The experimental results show that our method can provide a simple and accurate approach to full two-port calibration of the asymmetric test fixtures.

AB - Three known standards, including at least one transmission standard, are normally required for the full two-port calibration of test fixtures. Based on the triple-through method, a new general-purpose calibration procedure using only one known reflection standard is proposed in this paper. The experimental results show that our method can provide a simple and accurate approach to full two-port calibration of the asymmetric test fixtures.

KW - Calibration

KW - Deembedding

KW - Microwave network analyzer

KW - Scattering parameter measurement

KW - Test fixtures

UR - https://www.scopus.com/pages/publications/19944403972

U2 - 10.1002/mop.20847

DO - 10.1002/mop.20847

M3 - 文章

AN - SCOPUS:19944403972

SN - 0895-2477

VL - 45

SP - 438

EP - 441

JO - Microwave and Optical Technology Letters

JF - Microwave and Optical Technology Letters

IS - 5

ER -

An improved TM method for full two-port calibration of the asymmetric test fixtures

Abstract

Keywords

Access to Document

Other files and links

Fingerprint

Cite this