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Analysis of two-layer planar transmission lines with the point matching method

  • Ning Hua Zhu*
  • , Wei Qiu
  • , Edwin Yue Bun Pun
  • , Po Sheun Chung
  • *Corresponding author for this work
  • City University of Hong Kong
  • Sun Yat-Sen University

Research output: Contribution to journalArticlepeer-review

Abstract

A simple and fast computational method for analysing two-layer planar transmission lines is presented. This method is an extension of the point matching method used by Marcuse (1989). The calculated fields are used to estimate the characteristic impedance and the effective dielectric constant of the structure. The results agree well with the published data obtained using the spectral domain technique and the variational method. This method can be applied to analyse other coplanar lines for monolithic microwave integrated circuit (MMIC) applications.

Original languageEnglish
Pages (from-to)99-105
Number of pages7
JournalInternational Journal of Electronics
Volume80
Issue number1
DOIs
StatePublished - 1 Jan 1996
Externally publishedYes

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