Anomalous dislocation response to deformation strain in CrFeCoNiPd high-entropy alloys with nanoscale chemical fluctuations

  • Huiqiang Ying
  • , Xiao Yang
  • , Haiyan He*
  • , Ao Yan
  • , Ke An
  • , Yubin Ke
  • , Zhenduo Wu
  • , Song Tang
  • , Ziyou Zhang
  • , Hongliang Dong
  • , Stefanus Harjo
  • , Tamás Ungár
  • , He Zhu
  • , Qingya Sun
  • , Xun Li Wang
  • , Si Lan
  • *Corresponding author for this work

Research output: Contribution to journalArticlepeer-review

Abstract

Nanoscale chemical fluctuations and their effect on the deformation behavior of CrFeCoNi-based high-entropy alloys (HEAs) were investigated using small-angle scattering and in situ neutron diffraction measurements. Small-angle scattering results demonstrated the presence of nano (>10 nm) chemical fluctuations in the as-prepared CrFeCoNiPd HEAs, which was attributed to the negative mixing of enthalpy and the significant atomic radius difference between Pd and the constituent elements in the CrFeCoNi-based alloys. Subsequent tensile tests demonstrated that the yield and tensile strengths of the as-prepared CrFeCoNiPd HEA surpass those of the as-prepared CrMnFeCoNi HEA. Neutron diffraction data analysis revealed an anomalous response of dislocation evolution with the strain, including a more significant linear increase of dislocation density and a greater proportion of screw dislocations in the as-prepared CrFeCoNiPd HEA than in the as-prepared CrMnFeCoNi HEA, which contributed to its enhanced strength. This study paves a new avenue for developing high-performance alloys by modulating chemical fluctuations.

Original languageEnglish
Article number116181
JournalScripta Materialia
Volume250
DOIs
StatePublished - 1 Sep 2024

Keywords

  • Chemical fluctuation
  • High-entropy alloy
  • Neutron diffraction
  • Small-angle scattering

Fingerprint

Dive into the research topics of 'Anomalous dislocation response to deformation strain in CrFeCoNiPd high-entropy alloys with nanoscale chemical fluctuations'. Together they form a unique fingerprint.

Cite this