Buried channel waveguides using ion-exchange and field-assisted annealing in glass: Modeling and experiments

K. Liu; E. Y.B. Pun

doi:10.1117/12.579942

Buried channel waveguides using ion-exchange and field-assisted annealing in glass: Modeling and experiments

K. Liu^*
, E. Y.B. Pun

^*Corresponding author for this work

City University of Hong Kong

Research output: Contribution to journal › Conference article › peer-review

Abstract

Theoretical and experimental studies on buried ion-exchanged waveguides using field-assisted annealing (FAA) in erbium-doped phosphate glasses were reported. The procedure for making buried waveguides using a two-step process was demonstrated. An analytical model for the FAA process was developed, and both the refractive index profiles and the effective buried depths of these waveguides are predicted. This model is based upon the available data derived from the ion-exchanged planar waveguide measurements. The mode intensity profiles as well as the buried depths were measured with the use of standard end-fire coupling setup and a calibrated image capture card. The buried depths are found to be in good agreement with the simulated results.

Original language	English
Article number	59
Pages (from-to)	404-412
Number of pages	9
Journal	Proceedings of SPIE - The International Society for Optical Engineering
Volume	5595
DOIs	https://doi.org/10.1117/12.579942
State	Published - 2004
Externally published	Yes
Event	Active and Passive Optical Components for WDM Communications IV - Philadelphia, PA, United States Duration: 25 Oct 2004 → 28 Oct 2004

Keywords

Buried glass waveguides
Field-assisted annealing
Integrated optics
Ion exchange

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10.1117/12.579942

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title = "Buried channel waveguides using ion-exchange and field-assisted annealing in glass: Modeling and experiments",

abstract = "Theoretical and experimental studies on buried ion-exchanged waveguides using field-assisted annealing (FAA) in erbium-doped phosphate glasses were reported. The procedure for making buried waveguides using a two-step process was demonstrated. An analytical model for the FAA process was developed, and both the refractive index profiles and the effective buried depths of these waveguides are predicted. This model is based upon the available data derived from the ion-exchanged planar waveguide measurements. The mode intensity profiles as well as the buried depths were measured with the use of standard end-fire coupling setup and a calibrated image capture card. The buried depths are found to be in good agreement with the simulated results.",

keywords = "Buried glass waveguides, Field-assisted annealing, Integrated optics, Ion exchange",

author = "K. Liu and Pun, \{E. Y.B.\}",

year = "2004",

doi = "10.1117/12.579942",

language = "英语",

volume = "5595",

pages = "404--412",

journal = "Proceedings of SPIE - The International Society for Optical Engineering",

issn = "0277-786X",

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note = "Active and Passive Optical Components for WDM Communications IV ; Conference date: 25-10-2004 Through 28-10-2004",

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T1 - Buried channel waveguides using ion-exchange and field-assisted annealing in glass

T2 - Active and Passive Optical Components for WDM Communications IV

AU - Liu, K.

AU - Pun, E. Y.B.

PY - 2004

Y1 - 2004

N2 - Theoretical and experimental studies on buried ion-exchanged waveguides using field-assisted annealing (FAA) in erbium-doped phosphate glasses were reported. The procedure for making buried waveguides using a two-step process was demonstrated. An analytical model for the FAA process was developed, and both the refractive index profiles and the effective buried depths of these waveguides are predicted. This model is based upon the available data derived from the ion-exchanged planar waveguide measurements. The mode intensity profiles as well as the buried depths were measured with the use of standard end-fire coupling setup and a calibrated image capture card. The buried depths are found to be in good agreement with the simulated results.

AB - Theoretical and experimental studies on buried ion-exchanged waveguides using field-assisted annealing (FAA) in erbium-doped phosphate glasses were reported. The procedure for making buried waveguides using a two-step process was demonstrated. An analytical model for the FAA process was developed, and both the refractive index profiles and the effective buried depths of these waveguides are predicted. This model is based upon the available data derived from the ion-exchanged planar waveguide measurements. The mode intensity profiles as well as the buried depths were measured with the use of standard end-fire coupling setup and a calibrated image capture card. The buried depths are found to be in good agreement with the simulated results.

KW - Buried glass waveguides

KW - Field-assisted annealing

KW - Integrated optics

KW - Ion exchange

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M3 - 会议文章

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SN - 0277-786X

VL - 5595

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EP - 412

JO - Proceedings of SPIE - The International Society for Optical Engineering

JF - Proceedings of SPIE - The International Society for Optical Engineering

M1 - 59

Y2 - 25 October 2004 through 28 October 2004

ER -

Buried channel waveguides using ion-exchange and field-assisted annealing in glass: Modeling and experiments

Abstract

Keywords

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