Skip to main navigation Skip to search Skip to main content

Characterization of annealed proton‐exchanged LiNbO3 waveguides fabricated using toluic acid

  • K. K. Loi*
  • , E. Y.B. Pun
  • , P. S. Chung
  • *Corresponding author for this work
  • University of California at San Diego
  • City University of Hong Kong

Research output: Contribution to journalArticlepeer-review

Abstract

Annealing properties of proton‐exchanged optical waveguides in z‐cut LiNbO3 fabricated using toluic acid are reported. Variations in the surface refractive index and waveguide depth with annealing time are found to follow a power‐law relationship, and a minimum propagation loss of 0.23 dB/m is measured at 0.633‐μm wavelength. © 1993 John Wiley & sons, Inc.

Original languageEnglish
Pages (from-to)378-381
Number of pages4
JournalMicrowave and Optical Technology Letters
Volume6
Issue number6
DOIs
StatePublished - May 1993
Externally publishedYes

Keywords

  • integrated optics
  • lithium niobate
  • Optical waveguides
  • proton exchange

Fingerprint

Dive into the research topics of 'Characterization of annealed proton‐exchanged LiNbO3 waveguides fabricated using toluic acid'. Together they form a unique fingerprint.

Cite this