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Controlled intermixing in InGaAsP multiquantum wells by plasma immersion ion implantation of argon

  • H. P. Ho*
  • , K. C. Lo
  • , P. K. Chu
  • , K. S. Chan
  • , J. Li
  • , D. T.K. Kwok
  • , E. Y.B. Pun
  • , J. H. Marsh
  • *Corresponding author for this work
  • City University of Hong Kong
  • University of Glasgow

Research output: Contribution to journalArticlepeer-review

Abstract

In this paper, the diffusion enhanced intermixing effect in strained InGaAsP multiquantum wells due to plasma immersion ion implantation (PIII) of Ar+ and post-implant annealing is presented. Firstly, we report that a 20 kV Ar+ PIII at a fluency of 1016 cm-2 together with a furnace anneal at 650 °C resulted in an enhanced blue shift in the photoluminescence (PL) peak. It was also found that by varying the Ar+ dose or the implantation energy, we could control the extent of the implantation induced intermixing. For a sample that had half of the surface shielded during implantation, a bandgap step was observed between the implanted and non-implanted regions. Our results indicate that one can use this technique for localized fine-tuning of the bandgap energy, thus demonstrating its potential as a processing step for the fabrication of integrated photonic devices.

Original languageEnglish
Pages (from-to)304-310
Number of pages7
JournalNuclear Instruments and Methods in Physics Research, Section B: Beam Interactions with Materials and Atoms
Volume173
Issue number3
DOIs
StatePublished - Jan 2001
Externally publishedYes

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