Deformation of thin solid film/viscous layer/substrate structures with roughness interface between the viscous layer and substrate

Influence of a roughness interface between liquid layer and substrate on the deformation of the thin solid film/liquid/substrate laminate structure with residual compressive stress was studied by means of the energy method. The roughness of the interface is characterized by two ways such as a self-affine fractal and mound geometry. It is found that the stable deformation appearance of the structure is wrinkling and sinusoidal, which is similar with that for the structure with planar interface, but the wave number of the sinusoidal structure with planar interface can be changed remarkably with the roughness of the interface both for the interface with self-affine fractal geometry and mound geometry. For the interface with self-affine fractal geometry, the effect of the roughness is stronger when the amplitude of the roughness and the fractal dimension are larger. For mound the roughness interface, with increasing of the amplitude and decreasing of the average mound separation, the effects of roughness get more distinguished. It is concluded that the result when the interface is supposed to be planar is very different from that when the interface is nonplanar.