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Erbium doping in silicon by thermal indiffusion

  • Emile Man Wah Wong*
  • , Hongwei Liu
  • , Shi Qing Man
  • , Edwin Yue Bun Pun
  • , Po Sheun Chung
  • *Corresponding author for this work
  • City University of Hong Kong

Research output: Contribution to journalArticlepeer-review

Abstract

A rare-earth ion, namely erbium, was doped into silicon (Si) using thermal indiffusion. Codoping using ytterbium oxide (Yb2O3) and germanium (Ge) to increase photoluminescence (PL) intensity was also demonstrated, and the effect of different Yb/Er ratios on Si was studied. Room temperature PL intensity relative to Er-diffused sample was found to increase by ∼30 times using Yb/Er (27/1) codopant. When a SiGe/Yb/Er layer was used, room temperature PL intensity was further increased to more than 60 times.

Original languageEnglish
Pages (from-to)3669-3672
Number of pages4
JournalJapanese Journal of Applied Physics, Part 2: Letters
Volume37
Issue number6 SUPPL. B
DOIs
StatePublished - Jun 1998
Externally publishedYes

Keywords

  • Erbium
  • Photoluminescence
  • Rare-earth ion
  • Silicon
  • Thermal indiffusion

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