Abstract
We describe a new method for extracting the intrinsic response of a laser diode from S-parameters measured using a calibrated vector network analyzer. The experimental results obtained using the new method are compared with those obtained using the optical modulation method and the frequency response subtraction method. Good agreement has been obtained, confirming the new method validity and accuracy. The new method has the advantages of obtaining the intrinsic characteristics of a laser diode with conventional measurements using a network analyzer.
| Original language | English |
|---|---|
| Pages (from-to) | 744-746 |
| Number of pages | 3 |
| Journal | IEEE Photonics Technology Letters |
| Volume | 17 |
| Issue number | 4 |
| DOIs | |
| State | Published - Apr 2005 |
| Externally published | Yes |
Keywords
- Curve fitting
- Intrinsic response
- Laser diode
- Parasitic network
- S-parameters
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