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Extraction of intrinsic response from S-parameters of laser diodes

  • N. H. Zhu*
  • , C. Chen
  • , E. Y.B. Pun
  • , P. S. Chung
  • *Corresponding author for this work
  • CAS - Institute of Semiconductors
  • City University of Hong Kong

Research output: Contribution to journalArticlepeer-review

Abstract

We describe a new method for extracting the intrinsic response of a laser diode from S-parameters measured using a calibrated vector network analyzer. The experimental results obtained using the new method are compared with those obtained using the optical modulation method and the frequency response subtraction method. Good agreement has been obtained, confirming the new method validity and accuracy. The new method has the advantages of obtaining the intrinsic characteristics of a laser diode with conventional measurements using a network analyzer.

Original languageEnglish
Pages (from-to)744-746
Number of pages3
JournalIEEE Photonics Technology Letters
Volume17
Issue number4
DOIs
StatePublished - Apr 2005
Externally publishedYes

Keywords

  • Curve fitting
  • Intrinsic response
  • Laser diode
  • Parasitic network
  • S-parameters

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