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Guidelines for accurate evaluation of photodetectors based on emerging semiconductor technologies

  • Vincenzo Pecunia*
  • , Thomas D. Anthopoulos*
  • , Ardalan Armin
  • , Benjamin Bouthinon
  • , Mario Caironi
  • , Andres Castellanos-Gomez
  • , Yongsheng Chen
  • , Kilwon Cho
  • , Charlotte Clegg
  • , Xiaosheng Fang
  • , Peter Fendel
  • , Boyd Fowler
  • , Gerwin Gelinck
  • , Heinrich Gottlob
  • , Philippe Guyot-Sionnest
  • , Rob Hannebauer
  • , Gerardo Hernandez-Sosa
  • , Mark C. Hersam
  • , Lionel Hirsch
  • , Johnny C. Ho
  • Furkan H. Isikgor, Jérôme Joimel, Hyun Jae Kim, Gerasimos Konstantatos, John Labram, Max C. Lemme, Karl Leo, Emmanuel Lhuillier, Elefterios Lidorikis, Maria A. Loi, Pawel E. Malinowski, Patrick Merken, Thomas Mueller, Bahareh Nasrollahi, Dario Natali, Tse Nga Ng, Thuc Quyen Nguyen, Sung Kyu Park, Lian Mao Peng, Paolo Samorì, Edward H. Sargent, Liang Shen, Sanshiro Shishido, Ivan Shorubalko, Prashant Sonar, Samuel D. Stranks, Sandro F. Tedde, Koen Vandewal, Marc Verhaegen, Sumeet Walia, Feng Yan, Tomoyuki Yokota, Fujun Zhang
*Corresponding author for this work
  • Simon Fraser University
  • University of Manchester
  • Swansea University
  • VS Technology
  • Italian Institute of Technology
  • Instituto de Ciencia de Materiales de Madrid (ICMM-CSIC)
  • Nankai University
  • Pohang University of Science and Technology
  • Fudan University
  • Thorlabs, Inc.
  • OmniVision Technologies Inc.
  • Eindhoven University of Technology
  • High Tech Campus 31
  • Vishay Semiconductor GmbH
  • The University of Chicago
  • Lumiense Photonics Inc.
  • Karlsruhe Institute of Technology
  • InnovationLab GmbH
  • Northwestern University
  • Northwestern University
  • Laboratoire IMS
  • City University of Hong Kong
  • Yonsei University
  • The Barcelona Institute of Science and Technology
  • ICREA
  • University College London
  • RWTH Aachen University
  • AMO GmbH
  • Technische Universität Dresden
  • Sorbonne Université
  • University of Ioannina
  • University of Groningen
  • Interuniversitair Micro-Elektronica Centrum
  • Exosens Group
  • TU Wien
  • Polytechnic University of Milan
  • University of California at San Diego
  • University of California at Santa Barbara
  • Chung-Ang University
  • Peking University
  • Université de Strasbourg
  • University of Toronto
  • Jilin University
  • Panasonic Holdings Corporation
  • Swiss Federal Laboratories for Materials Science and Technology (Empa)
  • Queensland University of Technology
  • University of Cambridge
  • Siemens
  • Hasselt University
  • Photon Etc.
  • Royal Melbourne Institute of Technology University
  • Hong Kong Polytechnic University
  • The University of Tokyo
  • Beijing Jiaotong University

Research output: Contribution to journalArticlepeer-review

Abstract

Photodetector technologies based on emerging semiconductors—for example, organic semiconductors, halide perovskites, quantum dots, low-dimensional semiconductors and metal oxides—hold considerable promise for next-generation optoelectronics. However, the breadth and multidisciplinarity of this field, alongside its diverse range of applications, have resulted in inconsistent performance characterization and reporting practices, hindering the effective benchmarking of these technologies. Here we present a consensus among researchers from academia and industry on accurately capturing the key performance metrics of photodetectors based on emerging semiconductors and utilizing the photoelectric effect. We analyse their underlying assumptions, discuss common misunderstandings, and provide guidelines for accurate characterization and reporting. Additionally, we discuss the benchmarking of these photodetector technologies with respect to diverse applications. We expect that these comprehensive guidelines for characterization, reporting and benchmarking will accelerate and streamline further advancements in the field, propelling emerging photodetector technologies towards their full potential.

Original languageEnglish
Pages (from-to)1178-1188
Number of pages11
JournalNature Photonics
Volume19
Issue number11
DOIs
StatePublished - Nov 2025
Externally publishedYes

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