Small-signal and large-signal performance test of high-speed optoelectronics devices

N. H. Zhu; C. Chen; J. W. Sun; E. Y.B. Pun; P. S. Chung

doi:10.1117/12.579690

Small-signal and large-signal performance test of high-speed optoelectronics devices

N. H. Zhu^*
, C. Chen
, J. W. Sun
, E. Y.B. Pun
, P. S. Chung

^*Corresponding author for this work

CAS - Institute of Semiconductors
City University of Hong Kong

Research output: Contribution to journal › Conference article › peer-review

3 Scopus citations

Abstract

This paper presents measurement methods for determining the reflection coefficients and frequency responses of semiconductor laser diodes, photodiodes, and EA modulator chips. A novel method for determining the intrinsic frequency responses of laser diodes is also proposed, and applications of the developed measurement methods are discussed. We demonstrate the compensation of bonding wire on the capacitances of both the submount and the laser diode, and present a method for estimating the potential modulation bandwidth of TO packaging technique. Initial study on removing the effects of test fixture on large-signal performances of optoelectronic devices at high data rate is also given.

Original language	English
Article number	59
Pages (from-to)	308-319
Number of pages	12
Journal	Proceedings of SPIE - The International Society for Optical Engineering
Volume	5624
DOIs	https://doi.org/10.1117/12.579690
State	Published - 2005
Externally published	Yes
Event	Semiconductor and Organic Optoelectronic Materials and Devices - Beijing, China Duration: 9 Nov 2004 → 11 Nov 2004

Keywords

Intrinsic response
Laser diode
Measurement
Parasitic network
Scattering parameters
Test fixture

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@article{7a456b6a22df4df3a4c24f6aa2d8b6b6,

title = "Small-signal and large-signal performance test of high-speed optoelectronics devices",

abstract = "This paper presents measurement methods for determining the reflection coefficients and frequency responses of semiconductor laser diodes, photodiodes, and EA modulator chips. A novel method for determining the intrinsic frequency responses of laser diodes is also proposed, and applications of the developed measurement methods are discussed. We demonstrate the compensation of bonding wire on the capacitances of both the submount and the laser diode, and present a method for estimating the potential modulation bandwidth of TO packaging technique. Initial study on removing the effects of test fixture on large-signal performances of optoelectronic devices at high data rate is also given.",

keywords = "Intrinsic response, Laser diode, Measurement, Parasitic network, Scattering parameters, Test fixture",

author = "Zhu, \{N. H.\} and C. Chen and Sun, \{J. W.\} and Pun, \{E. Y.B.\} and Chung, \{P. S.\}",

year = "2005",

doi = "10.1117/12.579690",

language = "英语",

volume = "5624",

pages = "308--319",

journal = "Proceedings of SPIE - The International Society for Optical Engineering",

issn = "0277-786X",

publisher = "SPIE",

note = "Semiconductor and Organic Optoelectronic Materials and Devices ; Conference date: 09-11-2004 Through 11-11-2004",

}

TY - JOUR

T1 - Small-signal and large-signal performance test of high-speed optoelectronics devices

AU - Zhu, N. H.

AU - Chen, C.

AU - Sun, J. W.

AU - Pun, E. Y.B.

AU - Chung, P. S.

PY - 2005

Y1 - 2005

N2 - This paper presents measurement methods for determining the reflection coefficients and frequency responses of semiconductor laser diodes, photodiodes, and EA modulator chips. A novel method for determining the intrinsic frequency responses of laser diodes is also proposed, and applications of the developed measurement methods are discussed. We demonstrate the compensation of bonding wire on the capacitances of both the submount and the laser diode, and present a method for estimating the potential modulation bandwidth of TO packaging technique. Initial study on removing the effects of test fixture on large-signal performances of optoelectronic devices at high data rate is also given.

AB - This paper presents measurement methods for determining the reflection coefficients and frequency responses of semiconductor laser diodes, photodiodes, and EA modulator chips. A novel method for determining the intrinsic frequency responses of laser diodes is also proposed, and applications of the developed measurement methods are discussed. We demonstrate the compensation of bonding wire on the capacitances of both the submount and the laser diode, and present a method for estimating the potential modulation bandwidth of TO packaging technique. Initial study on removing the effects of test fixture on large-signal performances of optoelectronic devices at high data rate is also given.

KW - Intrinsic response

KW - Laser diode

KW - Measurement

KW - Parasitic network

KW - Scattering parameters

KW - Test fixture

UR - https://www.scopus.com/pages/publications/17644402497

U2 - 10.1117/12.579690

DO - 10.1117/12.579690

M3 - 会议文章

AN - SCOPUS:17644402497

SN - 0277-786X

VL - 5624

SP - 308

EP - 319

JO - Proceedings of SPIE - The International Society for Optical Engineering

JF - Proceedings of SPIE - The International Society for Optical Engineering

M1 - 59

T2 - Semiconductor and Organic Optoelectronic Materials and Devices

Y2 - 9 November 2004 through 11 November 2004

ER -

Small-signal and large-signal performance test of high-speed optoelectronics devices

Abstract

Keywords

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