Small-signal measurement of laser diode chips

Yu Liu; Ning Hua Zhu; E. Y.B. Pun; P. S. Chung

doi:10.1109/APCC.1999.820537

Small-signal measurement of laser diode chips

Yu Liu
, Ning Hua Zhu
, E. Y.B. Pun
, P. S. Chung

CAS - Institute of Semiconductors
City University of Hong Kong

Research output: Contribution to conference › Paper › peer-review

2 Scopus citations

Abstract

Presents an accurate technique for measuring the input reflection coefficient and the frequency response of semiconductor laser diode chips. The effects of packaging parasitics and test probes can be completely removed in the measurement.

Original language	English
Pages	1413-1415
Number of pages	3
DOIs	https://doi.org/10.1109/APCC.1999.820537
State	Published - 1998
Externally published	Yes
Event	5th Asia-Pacific Conference Communications and 4th Optoloelectronics Communications Conference, APCC/OECC 1999 - Beijing, China Duration: 18 Oct 1999 → 22 Oct 1999

Conference

Conference	5th Asia-Pacific Conference Communications and 4th Optoloelectronics Communications Conference, APCC/OECC 1999
Country/Territory	China
City	Beijing
Period	18/10/99 → 22/10/99

Keywords

Microwave network analyzer
Scattering-parameter measurement
Semiconductor laser diode
Test fixture calibration

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10.1109/APCC.1999.820537

Cite this

@conference{2283d70b45684b3fad6b770c25e17ea0,

title = "Small-signal measurement of laser diode chips",

abstract = "Presents an accurate technique for measuring the input reflection coefficient and the frequency response of semiconductor laser diode chips. The effects of packaging parasitics and test probes can be completely removed in the measurement.",

keywords = "Microwave network analyzer, Scattering-parameter measurement, Semiconductor laser diode, Test fixture calibration",

author = "Yu Liu and Zhu, \{Ning Hua\} and Pun, \{E. Y.B.\} and Chung, \{P. S.\}",

note = "Publisher Copyright: {\textcopyright} 1999 China Inst. Of Communications.; 5th Asia-Pacific Conference Communications and 4th Optoloelectronics Communications Conference, APCC/OECC 1999 ; Conference date: 18-10-1999 Through 22-10-1999",

year = "1998",

doi = "10.1109/APCC.1999.820537",

language = "英语",

pages = "1413--1415",

}

TY - CONF

T1 - Small-signal measurement of laser diode chips

AU - Liu, Yu

AU - Zhu, Ning Hua

AU - Pun, E. Y.B.

AU - Chung, P. S.

PY - 1998

Y1 - 1998

N2 - Presents an accurate technique for measuring the input reflection coefficient and the frequency response of semiconductor laser diode chips. The effects of packaging parasitics and test probes can be completely removed in the measurement.

AB - Presents an accurate technique for measuring the input reflection coefficient and the frequency response of semiconductor laser diode chips. The effects of packaging parasitics and test probes can be completely removed in the measurement.

KW - Microwave network analyzer

KW - Scattering-parameter measurement

KW - Semiconductor laser diode

KW - Test fixture calibration

UR - https://www.scopus.com/pages/publications/30544442804

U2 - 10.1109/APCC.1999.820537

DO - 10.1109/APCC.1999.820537

M3 - 论文

AN - SCOPUS:30544442804

SP - 1413

EP - 1415

T2 - 5th Asia-Pacific Conference Communications and 4th Optoloelectronics Communications Conference, APCC/OECC 1999

Y2 - 18 October 1999 through 22 October 1999

ER -

Small-signal measurement of laser diode chips

Abstract

Conference

Keywords

Access to Document

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