Abstract
We report Zr4+-doped Ti:LiNbO3 strip waveguide fabricated by Zr4+-diffusion-doping followed by diffusion of 8 μm wide, 100 nm thick Tistrips on a Z-cut congruent substrate. Optical study shows that the waveguide well supports both TE and TM, is single-mode at the 1.5 μm wavelength, and has a loss ≤ 1.3/1.5 dB/cm for the TE/TM mode. Secondary ion mass spectrometry study shows that the Zr4+-profile part having a Zr4+-concentration above the threshold of photorefractive damage covers 60% (70%) ordinary (extraordinary) index profile in the waveguide. We conclude that the waveguide is optical-damage-resistant.
| Original language | English |
|---|---|
| Pages (from-to) | 1715-1721 |
| Number of pages | 7 |
| Journal | Optical Materials Express |
| Volume | 5 |
| Issue number | 8 |
| DOIs | |
| State | Published - 2015 |
| Externally published | Yes |
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