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An improved TM method for full two-port calibration of the asymmetric test fixtures

  • Ning Hua Zhu*
  • , Chao Liu
  • , Edwin Y.B. Pun
  • , Po Sheun Chung
  • *此作品的通讯作者
  • CAS - Institute of Semiconductors
  • City University of Hong Kong

科研成果: 期刊稿件文章同行评审

摘要

Three known standards, including at least one transmission standard, are normally required for the full two-port calibration of test fixtures. Based on the triple-through method, a new general-purpose calibration procedure using only one known reflection standard is proposed in this paper. The experimental results show that our method can provide a simple and accurate approach to full two-port calibration of the asymmetric test fixtures.

源语言英语
页(从-至)438-441
页数4
期刊Microwave and Optical Technology Letters
45
5
DOI
出版状态已出版 - 5 6月 2005
已对外发布

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