摘要
Planar waveguide was fabricated in Er:Yb:phosphate glass by a single energy implantation of 2.5 MeV He+ at a dose of 1.6 × 1016 ions/cm2. The waveguide was characterized by prism coupling method, and the refractive index profile was reconstructed using the inverse Wentzel-Kramers-Brillouin method. The photoluminescence was also measured. The energy loss was simulated, and the results were compared and discussed with respect to the refractive index profile in the waveguide.
| 源语言 | 英语 |
|---|---|
| 页(从-至) | 1135-1137 |
| 页数 | 3 |
| 期刊 | Journal of Materials Research |
| 卷 | 16 |
| 期 | 4 |
| DOI | |
| 出版状态 | 已出版 - 4月 2001 |
| 已对外发布 | 是 |
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