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Multiple Glancing at Quality: Benchmark Dataset and Objective Quality Assessment Metric for Low-light Image Enhancement

  • Yudong Mao
  • , Peilin Chen
  • , Zhao Wang
  • , Qiuping Jiang
  • , Shiqi Wang*
  • *此作品的通讯作者

科研成果: 书/报告/会议事项章节会议稿件同行评审

摘要

Quality metrics play a crucial role in guiding the development of image enhancement algorithms, which have consistently sought effective quality assessment methodologies and comprehensive datasets. To address this need, we first built a large-scale dataset for low-light enhanced image quality assessment and gathered the corresponding subjective evaluation scores. Recently, vision-language pre-training models have demonstrated considerable potential in the realm of quality assessment. However, its efficacy is limited by the fine-grained perception in low-level quality assessment. As such, we further propose a novel quality assessment framework using contrastive prompt learning, which harnesses the robust priors of vision-language pre-training models to improve the perceptual capacity of deep networks for low-level quality features. Experiments on the proposed RSLE dataset show that our method outperforms existing SOTA image quality assessment methods. Our database and the source code will be made publicly available.

源语言英语
主期刊名ISCAS 2025 - IEEE International Symposium on Circuits and Systems, Proceedings
出版商Institute of Electrical and Electronics Engineers Inc.
ISBN(电子版)9798350356830
DOI
出版状态已出版 - 2025
已对外发布
活动2025 IEEE International Symposium on Circuits and Systems, ISCAS 2025 - London, 英国
期限: 25 5月 202528 5月 2025

出版系列

姓名Proceedings - IEEE International Symposium on Circuits and Systems
ISSN(印刷版)0271-4310

会议

会议2025 IEEE International Symposium on Circuits and Systems, ISCAS 2025
国家/地区英国
London
时期25/05/2528/05/25

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