Small-signal and large-signal performance test of high-speed optoelectronics devices

N. H. Zhu; C. Chen; J. W. Sun; E. Y.B. Pun; P. S. Chung

doi:10.1117/12.579690

Small-signal and large-signal performance test of high-speed optoelectronics devices

N. H. Zhu^*
, C. Chen
, J. W. Sun
, E. Y.B. Pun
, P. S. Chung

^*此作品的通讯作者

CAS - Institute of Semiconductors
City University of Hong Kong

科研成果: 期刊稿件 › 会议文章 › 同行评审

3 引用（Scopus）

摘要

This paper presents measurement methods for determining the reflection coefficients and frequency responses of semiconductor laser diodes, photodiodes, and EA modulator chips. A novel method for determining the intrinsic frequency responses of laser diodes is also proposed, and applications of the developed measurement methods are discussed. We demonstrate the compensation of bonding wire on the capacitances of both the submount and the laser diode, and present a method for estimating the potential modulation bandwidth of TO packaging technique. Initial study on removing the effects of test fixture on large-signal performances of optoelectronic devices at high data rate is also given.

源语言	英语
文章编号	59
页（从-至）	308-319
页数	12
期刊	Proceedings of SPIE - The International Society for Optical Engineering
卷	5624
DOI	https://doi.org/10.1117/12.579690
出版状态	已出版 - 2005
已对外发布	是
活动	Semiconductor and Organic Optoelectronic Materials and Devices - Beijing, 中国期限: 9 11月 2004 → 11 11月 2004

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title = "Small-signal and large-signal performance test of high-speed optoelectronics devices",

abstract = "This paper presents measurement methods for determining the reflection coefficients and frequency responses of semiconductor laser diodes, photodiodes, and EA modulator chips. A novel method for determining the intrinsic frequency responses of laser diodes is also proposed, and applications of the developed measurement methods are discussed. We demonstrate the compensation of bonding wire on the capacitances of both the submount and the laser diode, and present a method for estimating the potential modulation bandwidth of TO packaging technique. Initial study on removing the effects of test fixture on large-signal performances of optoelectronic devices at high data rate is also given.",

keywords = "Intrinsic response, Laser diode, Measurement, Parasitic network, Scattering parameters, Test fixture",

author = "Zhu, \{N. H.\} and C. Chen and Sun, \{J. W.\} and Pun, \{E. Y.B.\} and Chung, \{P. S.\}",

year = "2005",

doi = "10.1117/12.579690",

language = "英语",

volume = "5624",

pages = "308--319",

journal = "Proceedings of SPIE - The International Society for Optical Engineering",

issn = "0277-786X",

publisher = "SPIE",

note = "Semiconductor and Organic Optoelectronic Materials and Devices ; Conference date: 09-11-2004 Through 11-11-2004",

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TY - JOUR

T1 - Small-signal and large-signal performance test of high-speed optoelectronics devices

AU - Zhu, N. H.

AU - Chen, C.

AU - Sun, J. W.

AU - Pun, E. Y.B.

AU - Chung, P. S.

PY - 2005

Y1 - 2005

N2 - This paper presents measurement methods for determining the reflection coefficients and frequency responses of semiconductor laser diodes, photodiodes, and EA modulator chips. A novel method for determining the intrinsic frequency responses of laser diodes is also proposed, and applications of the developed measurement methods are discussed. We demonstrate the compensation of bonding wire on the capacitances of both the submount and the laser diode, and present a method for estimating the potential modulation bandwidth of TO packaging technique. Initial study on removing the effects of test fixture on large-signal performances of optoelectronic devices at high data rate is also given.

AB - This paper presents measurement methods for determining the reflection coefficients and frequency responses of semiconductor laser diodes, photodiodes, and EA modulator chips. A novel method for determining the intrinsic frequency responses of laser diodes is also proposed, and applications of the developed measurement methods are discussed. We demonstrate the compensation of bonding wire on the capacitances of both the submount and the laser diode, and present a method for estimating the potential modulation bandwidth of TO packaging technique. Initial study on removing the effects of test fixture on large-signal performances of optoelectronic devices at high data rate is also given.

KW - Intrinsic response

KW - Laser diode

KW - Measurement

KW - Parasitic network

KW - Scattering parameters

KW - Test fixture

UR - https://www.scopus.com/pages/publications/17644402497

U2 - 10.1117/12.579690

DO - 10.1117/12.579690

M3 - 会议文章

AN - SCOPUS:17644402497

SN - 0277-786X

VL - 5624

SP - 308

EP - 319

JO - Proceedings of SPIE - The International Society for Optical Engineering

JF - Proceedings of SPIE - The International Society for Optical Engineering

M1 - 59

T2 - Semiconductor and Organic Optoelectronic Materials and Devices

Y2 - 9 November 2004 through 11 November 2004

ER -

Small-signal and large-signal performance test of high-speed optoelectronics devices

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