Small-signal measurement of laser diode chips

Yu Liu; Ning Hua Zhu; E. Y.B. Pun; P. S. Chung

doi:10.1109/APCC.1999.820537

Small-signal measurement of laser diode chips

Yu Liu
, Ning Hua Zhu
, E. Y.B. Pun
, P. S. Chung

CAS - Institute of Semiconductors
City University of Hong Kong

科研成果: 会议稿件 › 论文 › 同行评审

2 引用（Scopus）

摘要

Presents an accurate technique for measuring the input reflection coefficient and the frequency response of semiconductor laser diode chips. The effects of packaging parasitics and test probes can be completely removed in the measurement.

源语言	英语
页	1413-1415
页数	3
DOI	https://doi.org/10.1109/APCC.1999.820537
出版状态	已出版 - 1998
已对外发布	是
活动	5th Asia-Pacific Conference Communications and 4th Optoloelectronics Communications Conference, APCC/OECC 1999 - Beijing, 中国期限: 18 10月 1999 → 22 10月 1999

会议

会议	5th Asia-Pacific Conference Communications and 4th Optoloelectronics Communications Conference, APCC/OECC 1999
国家/地区	中国
市	Beijing
时期	18/10/99 → 22/10/99

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10.1109/APCC.1999.820537

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@conference{2283d70b45684b3fad6b770c25e17ea0,

title = "Small-signal measurement of laser diode chips",

abstract = "Presents an accurate technique for measuring the input reflection coefficient and the frequency response of semiconductor laser diode chips. The effects of packaging parasitics and test probes can be completely removed in the measurement.",

keywords = "Microwave network analyzer, Scattering-parameter measurement, Semiconductor laser diode, Test fixture calibration",

author = "Yu Liu and Zhu, \{Ning Hua\} and Pun, \{E. Y.B.\} and Chung, \{P. S.\}",

note = "Publisher Copyright: {\textcopyright} 1999 China Inst. Of Communications.; 5th Asia-Pacific Conference Communications and 4th Optoloelectronics Communications Conference, APCC/OECC 1999 ; Conference date: 18-10-1999 Through 22-10-1999",

year = "1998",

doi = "10.1109/APCC.1999.820537",

language = "英语",

pages = "1413--1415",

}

TY - CONF

T1 - Small-signal measurement of laser diode chips

AU - Liu, Yu

AU - Zhu, Ning Hua

AU - Pun, E. Y.B.

AU - Chung, P. S.

PY - 1998

Y1 - 1998

N2 - Presents an accurate technique for measuring the input reflection coefficient and the frequency response of semiconductor laser diode chips. The effects of packaging parasitics and test probes can be completely removed in the measurement.

AB - Presents an accurate technique for measuring the input reflection coefficient and the frequency response of semiconductor laser diode chips. The effects of packaging parasitics and test probes can be completely removed in the measurement.

KW - Microwave network analyzer

KW - Scattering-parameter measurement

KW - Semiconductor laser diode

KW - Test fixture calibration

UR - https://www.scopus.com/pages/publications/30544442804

U2 - 10.1109/APCC.1999.820537

DO - 10.1109/APCC.1999.820537

M3 - 论文

AN - SCOPUS:30544442804

SP - 1413

EP - 1415

T2 - 5th Asia-Pacific Conference Communications and 4th Optoloelectronics Communications Conference, APCC/OECC 1999

Y2 - 18 October 1999 through 22 October 1999

ER -

Small-signal measurement of laser diode chips

摘要

会议

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学术指纹

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