摘要
First-order and second-order gratings for the 1.55 μm wavelength InGaAsP laser have been fabricated by e-beam lithography on the InP substrate. The pattern is transferred into the InP substrate by wet chemical etching using HNO3:HBr:H2O and reactive ion etching using the gas mixture CH4:H2:Ar2. The experimental results have proven that a PMMA resist of 200 nm thickness can not only stand up to wet chemical etching but also to reactive ion etching.
| 源语言 | 英语 |
|---|---|
| 页 | 1545-1547 |
| 页数 | 3 |
| DOI | |
| 出版状态 | 已出版 - 1998 |
| 已对外发布 | 是 |
| 活动 | 5th Asia-Pacific Conference Communications and 4th Optoloelectronics Communications Conference, APCC/OECC 1999 - Beijing, 中国 期限: 18 10月 1999 → 22 10月 1999 |
会议
| 会议 | 5th Asia-Pacific Conference Communications and 4th Optoloelectronics Communications Conference, APCC/OECC 1999 |
|---|---|
| 国家/地区 | 中国 |
| 市 | Beijing |
| 时期 | 18/10/99 → 22/10/99 |
学术指纹
探究 'The fabrication of grating for 1.55 μm InGaAsP DFB laser array by e-beam lithography' 的科研主题。它们共同构成独一无二的学术指纹。引用此
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